Spatial Profile Measurement of Femtosecond Laser - Compton X-rays
نویسندگان
چکیده
A femtosecond X-ray source was developed by Thomson scattering through interaction between a lowemittance picosecond electron beam and a terawatt femtosecond laser light at 90 configuration. The observed X-ray intensity with peak energy of 2.3 keV and pulse duration of 270 fs rms was typically 1.4x10 photons/pulse. The pulse-to-pulse fluctuation of the X-ray intensity was measured to be 25%. The spatial profile of the X-rays was measured with a technique of X-ray imaging on a phosphor screen using an image-intensified CCD camera. The dependence of the X-ray beam profile on the scattering laser polarization was obtained and compared with theoretical analysis.
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